dentification of genetic carriers of wheat steady againt common bunt Tilletia caries (DC.)
DOI:
https://doi.org/10.26577/EJE.2019.v61.i4.06Abstract
Abstract. One of the most widespread and dangerous diseases of wheat is the common bunt, which
is caused by the fungi Tilletia caries (DC.). The most effective method of combating smut is considered
to be genetic protection of plants, which is achieved by the introduction of new resistant samples to
common bunt wheat. There is information about more than 15 genes that can express resistance to this
disease. A number of molecular markers associated with the main genes of resistance to common bunt
have been developed. They will be used to create common bunt resistant samples by screening and
introgression of Bt-genes resistance into wheat samples with good economic value traits. The aim of
the study is to identify carriers of resistance to common bunt using molecular markers. Molecular and
phytopathological screening of Romanian wheat samples for resistance to common bunt Tilletia caries
(DC.) was carried out. Molecular screening of Romanian samples for resistance to common bunt showed
that 2 samples (02429GP-1, F08245G1) possess the Bt9 gene. When using a primer for PCR to the FSD
/ RSA locus, the Bt10 resistance gene was detected in two samples. As a result of phytopathological
analysis, it was found that 5 samples (02429GP-1, F08126G1, F08245G1, F08347G1, F07270G2) are
highly resistant to common bunt. Retezat showed a susceptible response with a lesion of 52%. The data
obtained are valuable in breeding programs to increase resistance to common bunt.
Key words: wheat, molecular screening, resistance genes, phytopathological assessment, common
bunt.